发明名称 EDDY CURRENT FLAW DETECTION PROBE
摘要 PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe containing almost no noise components caused by a lift-off in the output of a detection coil. SOLUTION: An exciting coil 1 is constituted by winding a winding 13 around the groove 12 provided to the outer periphery of an annular member 11, and a detection coil 2 whose front shape is polygonal is provided. One side of the detection coil 2 is laid over the inside of the exciting coil 1 in the diametric direction of the exciting coil 1, the opposed apexes of one side are arranged so as to be spaced apart from the exciting coil 1, and the detection coil 2 is allowed to cross the exciting coil 2 at a right angle. The side surface of the exciting coil 1 on the side opposite to the opposed apexes is set as a flaw detection surfaces to be opposed to the surface of an object T to be used. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003215107(A) 申请公布日期 2003.07.30
申请号 JP20020009298 申请日期 2002.01.17
申请人 MARKTEC CORP 发明人 HIROSHIMA TATSUO
分类号 G01N27/90;(IPC1-7):G01N27/90 主分类号 G01N27/90
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