| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for inspecting a liquid crystal display device capable of detecting the defective pixel of the liquid crystal display device generated accompanying deterioration with light of a pixel control element formed on a control element substrate constituting the liquid crystal display device not after assembling of the liquid crystal display device but in the state of the control element substrate. SOLUTION: Before constituting the liquid crystal display device, the pixel control element of a control element substrate is irradiated with light to measure the electrical characteristic value of the pixel control element to judge the quality of the control element substrate. In addition, the electrical characteristic value of the pixel control element is measured by varying the intensity of the light with which the pixel control element is irradiated. The inspecting device is provided with a light irradiating means for irradiating the pixel control element of the control element substrate before constituting the liquid crystal display device with light, a measuring means for measuring the electrical characteristic value of the pixel control element irradiated with the light by the light irradiating means, and a judging means for judging the quality of the control element substrate on the bases of the electrical characteristic value measured by the measuring means. COPYRIGHT: (C)2003,JPO
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