| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit and a method for testing a semiconductor integrated circuit, which can easily test a limitation of an operation cycle, i.e., a delay characteristic of the semiconductor integrated circuit device at an arbitrary cycle in a function test pattern of the semiconductor integrated circuit, by using the function test pattern and a relatively slow clock signal input from the outside. SOLUTION: The test circuit includes a one-shot circuit which generates a prescribed one-shot signal from a clock signal input from the outside by using a first delay adjusting signal, a variable delay circuit which delays an output signal from the one-shot circuit for a prescribed period by using a second delay adjusting signal, a NAND circuit which inverts an output signal from the variable delay circuit and outputs it, and an AND circuit which products an AND signal of an output signal from the NAND circuit and the clock signal input from the outside. COPYRIGHT: (C)2003,JPO
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