TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a tester for semiconductor integrated circuits. SOLUTION: By this tester, a plurality of semiconductor integrated circuits can be tested in parallel using a test data stored in a set of memories. Accordingly, the production cost of the tester can be reduced, compared to a conventional tester which requires sets of memories whose number of sets is proportional to that of integrated circuits being devices under test. COPYRIGHT: (C)2003,JPO