| 摘要 |
After initializing a Direct Rambus DRAM under test with initialization data, an address, pattern data and mask data are provided to the memory to effect therein a byte-wise masked write of the pattern data, and parallel mask data is converted to plural pieces of serial mask data in accordance with burst addresses generated in a burst address generating means. Based on the bit logical value of each serial mask data, it is decided whether data of each byte is write-enabled or not in the byte-wise masked write, based on the bit logical value of each serial mask data and either one of the initialization data and the byte-wise masked written pattern data is selected to generate expectation data.
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