| 摘要 |
PROBLEM TO BE SOLVED: To provide an inexpensive sure test method not requiring an expensive dedicated module, and to reduce a facility introduction cost. SOLUTION: In this semiconductor testing device for testing a semiconductor integrated circuit including both a D/A conversion circuit and an A/D conversion circuit, analog signal output terminals of D/A conversion circuits of semiconductor integrated circuits to be measured on one side are connected respectively to analog signal input terminals of A/D conversion circuits of semiconductor integrated circuits to be measured on the other side, by using four semiconductor integrated circuits to be measured 20, 30, 40, 50. The semiconductor testing device 10 tests each D/A conversion circuit and A/D conversion circuit of the semiconductor integrated circuits to be measured 20, 30, 40, 50, based on digital signals outputted from each A/D conversion circuit of the semiconductor integrated circuits to be measured 20, 30, 40, 50, to thereby discriminated between a quality product and a defective product. COPYRIGHT: (C)2003,JPO
|
