| 摘要 |
PROBLEM TO BE SOLVED: To perform a level test of an input/output buffer of a semiconductor device without bringing a probe into contact with each input/output pad. SOLUTION: A power source system and a ground system of the input buffer and the output buffer are formed as different systems in this semiconductor device having a boundary scan loaded thereon, to thereby enable to set a power source voltage and a ground voltage individually. COPYRIGHT: (C)2003,JPO
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