发明名称 METHOD FOR FABRICATING INFRARED BOLOMETER
摘要 PURPOSE: A method for fabricating an infrared bolometer is provided to improve infrared absorption efficiency by forming a metal layer made of zirconium on a silicon oxide layer formed over an absorption level. CONSTITUTION: A supporting level structure includes a lower conductive line(124) connected to a corresponding connection terminal while the first sacrificial layer is interposed between a driving substrate and the supporting level structure. The second sacrificial layer is formed to fill the supporting level structure. A part of the second sacrificial layer is selectively eliminated to form a post formation hole exposing a part of the upper portion of the lower conductive line. A supporting layer(122) is formed on the entire region except the upper portion of the exposed lower conductive line. An upper conductive line(144) connected to the exposed lower conductive line is formed on the upper supporting bridge material. A silicon oxide layer(146) is formed on the entire front surface of the upper conductive line. The metal layer(148) made of zirconium is formed on the entire front surface of the silicon oxide layer. A part of the metal layer, the silicon oxide layer and the supporting layer is partially removed to expose a part of the upper portion of the second sacrificial layer so that a post of a cell unit and a detection level structure are formed. The first and second sacrificial layers are eliminated to form a bolometer structure on each cell unit.
申请公布号 KR20030062061(A) 申请公布日期 2003.07.23
申请号 KR20020002475 申请日期 2002.01.16
申请人 DAEWOO ELECTRONICS CORPORATION 发明人 CHOI, YONG WON
分类号 H01L31/09;(IPC1-7):H01L31/09 主分类号 H01L31/09
代理机构 代理人
主权项
地址