发明名称 Pattern data inspection method and storage medium
摘要 A pattern data inspection method includes the steps of (a) carrying out a logical/sizing process with respect to original pattern data, (b) carrying out a reverse-logical/reverse-sizing process with respect to pattern data subjected to the logical/sizing process, and (c) carrying out a logical process with respect to the original pattern data and pattern data subjected to the reverse-logical/reverse-sizing process, and inspecting the pattern data subjected to the logical/sizing process.
申请公布号 US6598185(B1) 申请公布日期 2003.07.22
申请号 US20000514151 申请日期 2000.02.28
申请人 FUJITSU LIMITED 发明人 MATSUI SHOWGO;TABARA KATSUJI;TAKAHASHI KAZUHIKO;SHIOZAWA KUNIHIKO;OOTANI YOSHIHARU;KATASE SYUZI
分类号 H01L21/82;G03F1/00;G03F1/08;G03F1/68;G03F1/70;G03F7/20;G06F17/50;(IPC1-7):H02H3/05;G06K9/00 主分类号 H01L21/82
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