| 摘要 |
PROBLEM TO BE SOLVED: To efficiently perform measurement with high accuracy in a measuring device utilizing total reflection. SOLUTION: This measuring plate is provided with a metallic film 14 formed on a bottom inner face of a well 12a of 8×6 among wells 12 arranged at pitches in accordance with predetermined standard in the shape of matrix of 8×12, on a surface of a plate base 11 having the outer shape same as the predetermined standard of a microtiter plate, and a dielectric block 16 is formed on a bottom outer face. The dielectric block 16 is composed of the thick projecting part formed on the bottom of the wall 12a, and has an incoming face 16a for allowing the predetermined optical beam to enter into an interface between the bottom face of the measuring well 12a and the metallic film 14, and an outgoing face 16b for allowing the optical beam total-reflected by the interface to outgo. COPYRIGHT: (C)2003,JPO
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