| 摘要 |
PROBLEM TO BE SOLVED: To provide a test device and a test method which can test simultaneously a plurality of memory devices of which performances such as pause capability or the like are different. SOLUTION: The device is provided with a connection section 22A connecting DUT such as a DRAM or the like, a driver circuit 21A giving a write-in signal to the connection section corresponding to a test pattern outputted from a test pattern generating device 1, a timer 24A setting a pause time of DUT and a read time, a determination circuit 23A connected to the connection section, determining a normal/defective condition of DUT based on a level of a read signal from DUT, and transmitting a discriminated result to a result processing circuit 3, and a plurality of test circuits 24A having a counter 25A controlling operation of the driver circuit and the determination circuit corresponding to the test pattern, and a plurality of DUTs connected to the connection section of each circuit are tested simultaneously. COPYRIGHT: (C)2003,JPO
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