发明名称 PROBE AND PROBE UNIT FOR PROBE CARD, PROBE CARD AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To manufacture a probe card in low cost and in a short period by manufacturing a probe for a probe card from bulk material of metallic glass. SOLUTION: By a press work, the bulk material of the metallic glass is formed to be a shape in the thickness direction of the probe below crystallization temperature so as to form a probe plate (S10). Then, a contactor is formed at one end of the probe plate (S12), each probe is formed from the probe plate (S14), and the probe is attached and wired to a mainframe substrate (S16). Thereby, the bulk material of the metallic glass is worked, the probe is formed, and the probe card is manufactured. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003202350(A) 申请公布日期 2003.07.18
申请号 JP20010401271 申请日期 2001.12.28
申请人 TOKYO CATHODE LABORATORY CO LTD 发明人 TAKAGI HIROYUKI;TERADA MASANORI;NAGANO MASAMI;REI YOUMEI
分类号 G01R31/26;G01R1/067;G01R1/073;H01L21/66;(IPC1-7):G01R1/067 主分类号 G01R31/26
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