发明名称 |
INTERFEROMETER, EXPOSURE DEVICE AND EXPOSURE METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an interferometer capable of measuring in high accuracy even when a moving mirror is slightly tilted. SOLUTION: This interferometer 90 for measuring the displacement of the moving mirror in accordance with an interference of a reference beam going to and from a fixed mirror 89 on an optical path and a measuring beam going to and from the moving mirror 88 on the optical path is provided with a wave front adjusting means 5 adjusting a wave front of the reference bean (or the measuring beam) to restrain the occurrence of a measurement error attributable to a tilt of the moving mirror. The wave front adjusting means is provided in the optical path between a beam splitter 2 splitting a beam from a beam source 1 into the reference beam going to the fixed mirror and the measuring beam going to the moving mirror and the fixed mirror (or the moving mirror). COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003202204(A) |
申请公布日期 |
2003.07.18 |
申请号 |
JP20020000222 |
申请日期 |
2002.01.07 |
申请人 |
NIKON CORP |
发明人 |
KAWAGUCHI TORU;SHODA TAKAHIRO |
分类号 |
G01B9/02;G03F7/20;H01L21/027;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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