发明名称 |
RUTHENIUM COMPOUND FOR ORGANOMETALLIC CHEMICAL VAPOR DEPOSITION METHOD, AND RUTHENIUM-CONTAINING THIN FILM OBTAINED FROM THE COMPOUND |
摘要 |
PROBLEM TO BE SOLVED: To provide a ruthenium compound for an organometallic chemical vapor deposition method by which proper film deposition rate can be obtained by an organometallic chemical vapor deposition method using a solid sublimation process and also to provide a ruthenium-containing thin film having excellent step coverage characteristics and surface morphology and superior electrical properties. SOLUTION: In this ruthenium compound for an organometallic chemical vapor deposition method, 10 to 100 ppm rhenium is incorporated into a ruthenium compound composed of bis(cyclopentadienyl)ruthenium complex. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003201564(A) |
申请公布日期 |
2003.07.18 |
申请号 |
JP20020001226 |
申请日期 |
2002.01.08 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
HIRAKOSO HIDEYUKI;ISHIKAWA MASAYUKI;OGI KATSUMI |
分类号 |
C23C16/18;H01L21/28;H01L21/285;(IPC1-7):C23C16/18 |
主分类号 |
C23C16/18 |
代理机构 |
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