发明名称 RUTHENIUM COMPOUND FOR ORGANOMETALLIC CHEMICAL VAPOR DEPOSITION METHOD, AND RUTHENIUM-CONTAINING THIN FILM OBTAINED FROM THE COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide a ruthenium compound for an organometallic chemical vapor deposition method by which proper film deposition rate can be obtained by an organometallic chemical vapor deposition method using a solid sublimation process and also to provide a ruthenium-containing thin film having excellent step coverage characteristics and surface morphology and superior electrical properties. SOLUTION: In this ruthenium compound for an organometallic chemical vapor deposition method, 10 to 100 ppm rhenium is incorporated into a ruthenium compound composed of bis(cyclopentadienyl)ruthenium complex. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003201564(A) 申请公布日期 2003.07.18
申请号 JP20020001226 申请日期 2002.01.08
申请人 MITSUBISHI MATERIALS CORP 发明人 HIRAKOSO HIDEYUKI;ISHIKAWA MASAYUKI;OGI KATSUMI
分类号 C23C16/18;H01L21/28;H01L21/285;(IPC1-7):C23C16/18 主分类号 C23C16/18
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