发明名称 Flash memory including means of checking memory cell threshold voltages
摘要 A FLASH memory erasable by page includes a flash memory array containing a plurality of floating gate transistors arranged in pages, and a checking circuit for checking the threshold voltages of the floating gate transistors. Programmed transistors that have a threshold voltage less than a given threshold are reprogrammed. The checking circuit includes a non-volatile counter formed by at least one row of floating gate transistors, a reading circuit for reading the address of a page to be checked in the counter, and an incrementing circuit for incrementing the counter after a page has been checked.
申请公布号 US2003133344(A1) 申请公布日期 2003.07.17
申请号 US20030352581 申请日期 2003.01.28
申请人 STMICROELECTRONICS S.A. 发明人 CAVALERI PAOLA;LECONTE BRUNO;ZINK SEBASTIEN;DEVIN JEAN
分类号 G11C16/10;G11C16/34;(IPC1-7):G11C7/00 主分类号 G11C16/10
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