发明名称 Semiconductor device fabricating method and treating liquid
摘要 There are provided a semiconductor device fabricating method for forming a wiring layer on a semiconductor substrate, followed by cleaning, which may prevent elution and oxidation of the wiring layer, and a treating liquid used in the fabricating method. A Cu wiring, an interlayer film over the Cu wiring and an opening in the interlyaer film to expose the surface of the Cu wiring are formed in a plasma atmosphere. IPA is sprayed to the semiconductor device, and then, an organic release process is performed thereto with an amine solvent to remove an etching residue. The semiconductor device is rinsed with the IPA again to remove the remaining amine, and then is cleaned with a treating liquid, which is alkalescent. Then, it is rinsed with pure water or CO2 water and is dried.
申请公布号 US2003134507(A1) 申请公布日期 2003.07.17
申请号 US20030339658 申请日期 2003.01.10
申请人 NEC CORPORATION 发明人 AOKI HIDEMITSU;NAKABEPPU KENICHI;TOMIMORI HIROAKI;TAKEWAKI TOSHIYUKI;HIRONAGA NOBUO;KUNISHIMA HIROYUKI
分类号 H01L21/306;H01L21/311;H01L21/768;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/306
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