发明名称 Semiconductor integrated circuit
摘要 Micro-computer capable of independently testing an additional logic for user and a pre-existing micro-computer portion in a shipment test of the micro-computer having the enclosed additional logic for user. A logic dedicated to connection is directly coupled to an internal bus of the micro-computer and is provided between the additional logic for user and the micro-computer . For testing the additional logic for user, a bus/port changeover terminal of the micro-computer and a read/write signal are used to effect readout/writing. Also, a bus inspection register is provided in the logic dedicated to connection. For testing the micro-computer, an output of the inspection register is read out to a bus of the logic dedicated to connection to inspect the bus. <IMAGE>
申请公布号 EP0917068(A3) 申请公布日期 2003.07.16
申请号 EP19980121122 申请日期 1998.11.10
申请人 NEC ELECTRONICS CORPORATION 发明人 MINE, KAZUMASA
分类号 G01R31/28;G06F11/22;G06F11/267;G06F13/24;G06F15/78;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址