发明名称 CONTRAST SENSITIVITY MEASURING APPARATUS AND CONTRAST SENSITIVITY MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a contrast sensitivity measuring apparatus capable of precisely measuring the contrast sensitivity of a subject in a short examination period. <P>SOLUTION: The contrast sensitivity measuring apparatus comprises a contrast target presenting part 100 for presenting first and second contrast targets disposed side by side, a pupillary data measuring part 200 for forming an image of the subject's front eye part and measuring the diameter and/or area of the pupillary zone of the subject, and a measuring timing forming part 300 for forming the measuring timing of the pupillary data measuring part 200 based on the timing for the contrast target presenting part 100 to present the first and second contrast targets. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003199712(A) 申请公布日期 2003.07.15
申请号 JP20010401812 申请日期 2001.12.28
申请人 TOPCON CORP 发明人 MIHASHI TOSHIBUMI
分类号 A61B3/06;A61B3/11 主分类号 A61B3/06
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