发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve frequency characteristics in a lateral PNP transistor. SOLUTION: A method for manufacturing a semiconductor device comprises steps of ion-implanting an impurity in a boundary of an emitter layer 14, then heat-treating to diffuse the impurity to form an ion implanted layer 20 in the case of forming the lateral PNP transistor having an emitter layer 14 having a P-type impurity, a base layer 15 having an N-type impurity and a collector layer 13 having a P-type impurity disposed on a surface of a semiconductor substrate (P-type substrate 10) along an in-plane direction. The method further comprises a step of forming a concentration gradient of the impurity by the layer 20 along the in-plane direction as the substrate between the collector layer 13 and the emitter layer 14. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003197628(A) 申请公布日期 2003.07.11
申请号 JP20010399346 申请日期 2001.12.28
申请人 MITSUMI ELECTRIC CO LTD 发明人 MOTOFUSA KEIICHIRO
分类号 H01L21/331;H01L29/73;(IPC1-7):H01L21/331 主分类号 H01L21/331
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