发明名称 |
SEMICONDUCTOR DEVICE, CIRCUIT MODULE WITH SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of specifying the cause of electrical faulty connection under a condition that the device is mounted on a print wiring plate as it is. SOLUTION: The semiconductor device 2 is provided with a base 14 having a terminal surface 4b opposed to the print wiring plate 3 and a plurality of peripheral surfaces 16 extended from the outer peripheral rim of the terminal surface toward the opposite side of the print wiring plate. A plurality of solder balls 8 connected to the pad 29 of the print wiring plate are arrayed on the terminal surface of the base with the shape of a lattice. The solder balls are electrically connected to an IC chip 10. A plurality of wirings 20 electrically connected to the solder balls are arranged on the terminal surfaces of the base. Respective wirings are provided with lead-out units 21 guided from the terminal surface of the base to the peripheral surface of the same while the probe of a tester is contacted with the lead-out units. COPYRIGHT: (C)2003,JPO |
申请公布号 |
JP2003197819(A) |
申请公布日期 |
2003.07.11 |
申请号 |
JP20010397447 |
申请日期 |
2001.12.27 |
申请人 |
TOSHIBA CORP |
发明人 |
HARADA SUSUMU |
分类号 |
H01L23/12;H01L21/60;(IPC1-7):H01L23/12 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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