发明名称 METHOD AND APPARATUS FOR INSPECTING AND PACKING CHIPS
摘要 <p>Disclosed are a method and apparatus for simultaneously inspecting and packaging chips, the method comprising a first step for advancing a film having a plurality of chip receiving recesses thereon from a film supplying roll to a film recovery roll by a step movement, inserting an uninspected chip into the chip receiving recess of the film, inspecting the chip passing under a three dimensional measuring probe by the three dimensional measuring probe, and replacing the inspected chip with a new chip by a robot arm when the probe determines that the inspected chip is abnormal, and a second step for attaching a tape onto the film to close an opening of the chip receiving recess having a normal chips therein after the first step is performed.</p>
申请公布号 WO2003056623(A1) 申请公布日期 2003.07.10
申请号 KR2002002420 申请日期 2002.12.24
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