发明名称 SUBSTRATE SCANNING APPARATUS
摘要 An optical scanning system (10) for examining material associated with a substrate (45) includes at least one scanning module (40) for displacing two or more objective lenses, at least one optical coupling system and a translation system. The two objective lenses are mounted on one or more scan arms and are constructed to scan over regions or subregions associated with the substrate. The scanning module is configured to displace the scan arm(s) to perform the scan and thereby displace the two objective lenses. Each objective lens is arranged to deliver light to the material and collect light from the material.
申请公布号 WO02052250(A3) 申请公布日期 2003.07.10
申请号 WO2001US24440 申请日期 2001.08.03
申请人 PERLEGEN SCIENCES;MONTAGU, JEAN, I.;STERN, DAVID 发明人 MONTAGU, JEAN, I.;STERN, DAVID
分类号 G01N21/64 主分类号 G01N21/64
代理机构 代理人
主权项
地址