| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a photoelectron measuring instrument that can simultaneously perform both photoelectron spectroscopy and photoelectron diffraction measurement in the course of time-of-flight photoelectron spectroscopy. <P>SOLUTION: This photoelectron measuring instrument which measures the flight time of photoelectrons generated from a sample when a pulsed X-rays are projected upon the sample is provided with a solid angle control means 10 which controls the generated solid angles of the photoelectrons. This instrument simultaneously performs both the photoelectron spectroscopy and photoelectron diffraction measurement by performing the photoelectron diffraction measurement by measuring the flight time of the photoelectrons and, at the same time, performing the photoelectron spectroscopy by controlling the generated solid angles of the photoelectrons by means of the control means 10. <P>COPYRIGHT: (C)2003,JPO</p> |
