发明名称 |
Minimization of metal migration in magnetic random access memory |
摘要 |
A method for mitigating metal migration in magnetic cell structures. The method includes directing flow of currents to provide substantially consistent and statistically symmetrical current flow in the conductors of the magnetic cell structures.
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申请公布号 |
US2003123280(A1) |
申请公布日期 |
2003.07.03 |
申请号 |
US20020037843 |
申请日期 |
2002.01.02 |
申请人 |
BROWN MICHAEL A. |
发明人 |
BROWN MICHAEL A. |
分类号 |
G11C11/155;(IPC1-7):G11C11/14;G11C5/06 |
主分类号 |
G11C11/155 |
代理机构 |
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