发明名称 INSTRUMENT FOR MEASURING PARAMETER FOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To measure a parameter without being affected by a skew. SOLUTION: This measuring instrument is constituted at least of a signal measuring means 30 for outputting an input clock signal CK0 and an input data signal DATA0 for measurement, and a skew absorbing means 40 for absorbing the skews in the input clock signal and the input data signal. A clock signal CKin for measurement and a data signal DATAin for measurement of which the skews are absorbed are supplied to an integrated circuit 10, and the parameter (for example, a set-up time and a holding time) of the integrated circuit in signal writing are measured based on an output signal DATAout for determination output from the integrated circuit. The parameter is measured highly precisely since the skews are measured based on the clock signal CKin for the measurement and the data signal DATAin for the measurement of which the skews are absorbed. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003185717(A) 申请公布日期 2003.07.03
申请号 JP20010388020 申请日期 2001.12.20
申请人 SONY CORP 发明人 TSUJI MASATAKA;SAGARA ATSUSHI
分类号 G01R31/319;G01R31/317;G01R31/3183;(IPC1-7):G01R31/319;G01R31/318 主分类号 G01R31/319
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