发明名称 Wafer drying method
摘要 A method for drying a semiconductor substrate includes the steps of clearing the substrate by supplying a liquid into a processing bath of a chamber, injecting first dry gases onto a surface of the supplied liquid, draining the liquid from the processing bath so that the substrate is slowly exposed to the surface of the liquid, and injecting a second dry gas into the chamber and forcibly exhausting gas in the chamber.
申请公布号 US2003124878(A1) 申请公布日期 2003.07.03
申请号 US20020183788 申请日期 2002.06.26
申请人 DNS KOREA CO., LTD 发明人 BAE JEONG-YONG;YOON CHANG-RO;PARK PYENG-JAE
分类号 F26B9/06;H01L21/00;H01L21/302;H01L21/304;(IPC1-7):H01L21/302 主分类号 F26B9/06
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