发明名称 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 A substrate processing apparatus has a process space (11C) containing a substrate to be processed and a plasma creating space (11B) not containing the substrate and separated from the process space (11C) by a control electrode (131). The control electrode is composed of a conductive member having openings (131a) through which a plasma created in a process vessel passes. The control electrode is covered with aluminum oxide or conductive nitride. A gas containing He and N<sb>2</sb> is supplied into the process chamber of the substrate processing apparatus. A plasma is created under such a condition that atomic nitrogen N* is excited in the plasma creating space, and the substrate is nitrided with the atomic nitrogen N*.
申请公布号 WO03054949(A1) 申请公布日期 2003.07.03
申请号 WO2002JP12926 申请日期 2002.12.10
申请人 OHMI, TADAHIRO;TOKYO ELECTRON LIMITED;SUGAWA, SHIGETOSHI;HIRAYAMA, MASAKI 发明人 OHMI, TADAHIRO;SUGAWA, SHIGETOSHI;HIRAYAMA, MASAKI
分类号 C23C16/56;C23C8/36;C23C16/02;C23C16/511;H01J37/32;H01L21/31;H01L21/314;H01L21/318;(IPC1-7):H01L21/318 主分类号 C23C16/56
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