| 摘要 |
PROBLEM TO BE SOLVED: To remarkably reduce the manhours for preparing a test program used when a semiconductor memory is tested. SOLUTION: An address/data generator 9, a buffer 10 and a command generator 11 are provided in a memory test device. The address/data generator 9 generates a basic address, a basic data, and cycle information such as a cycle identification information, based on a program main body part PH, so as to be output to the buffer 10. The command generator 11 generates an actual address, an actual data, and various kinds of commands based on the input cycle information, using a cycle definition part CP. The test program comprises the program main body part PH, and the cycle definition part CP, and only rewriting for the cycle definition part CP for defining the information depending on the semiconductor memory is enough to conduct the test easily when the different kind of the semiconductor memory is tested. COPYRIGHT: (C)2003,JPO
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