发明名称 Method of avoiding the effects of lack of uniformity in trench isolated integrated circuits
摘要 Method for fabricating integrated circuits comprising non-volatile memory cell matrices and peripheral circuits, said method comprising the steps of preparing a silicon substrate, carrying out a shallow trench isolation process on the silicon substrate to form active areas of exposed silicon isolated from one another by trenches filled with field oxide, growing a thin oxide layer on the active areas, masking the substrate areas intended for the memory cell matrices and etching the thin oxide layer and the field oxide by a chemical etch for a time longer than the time needed for removing the thin oxide layer entirely from the substrate areas intended for the peripheral circuits.
申请公布号 US6586313(B2) 申请公布日期 2003.07.01
申请号 US20010997227 申请日期 2001.11.29
申请人 STMICROELECTRONICS S.R.L. 发明人 PIVIDORI LUCA
分类号 H01L21/3105;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/3105
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