| 摘要 |
PROBLEM TO BE SOLVED: To provide a voltage detection circuit test device for testing a voltage detection circuit simply, accurately in a short time. SOLUTION: In this voltage detection circuit test device 1, a counter circuit 2 counts a reference clock CLK which is an input clock and outputs a digital signal having the number of bits corresponding to a counted value Cd to a D/A conversion circuit 3, and the D/A conversion circuit 3 performs analog conversion of the counted value Cd and inputs a sweep voltage Vs rising or falling at a prescribed step width into a semiconductor voltage detection circuit 10. When the sweep voltage Vs reaches a specified detection voltage Vg, a semiconductor voltage detection circuit 10 outputs a voltage detection flag signal Sf to the counter circuit 2 as an enable signal, and the counter circuit 2 stops counting and holds the counted value, and the counted value is used as the detection voltage Vg of the semiconductor voltage detection circuit 10. COPYRIGHT: (C)2003,JPO
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