发明名称 |
THIN FILM TRANSISTOR, ITS FABRICATING METHOD AND LIQUID CRYSTAL DISPLAY |
摘要 |
PURPOSE: To provide a method for fabricating a thin film transistor comprising TFTs different in thickness of gate insulation film on the same substrate in which breakdown voltage is prevented from deteriorating and the operation of a parasitic TFT can be suppressed at the edge part of an operating layer while scaling down furthermore. CONSTITUTION: The method for fabricating a thin film transistor comprises a step for forming a negative photoresist film 26 on a first insulating film 25 covering a first insular semiconductor film 24a, a step for forming a resist mask having an opening from the circumferential edge of the first insular semiconductor film 24a to the surface on the inside by exposing and developing the negative photoresist film 26 from the rear side of a transparent substrate 21, a step for etching the first insulating film 25 in the opening of the resist mask, a step for forming a second insulating film covering the first insulating film 25 and a conductor film thereon, and a step for forming first and second gate electrodes. |
申请公布号 |
KR20030052995(A) |
申请公布日期 |
2003.06.27 |
申请号 |
KR20020080612 |
申请日期 |
2002.12.17 |
申请人 |
FUJITSU DISPLAY TECHNOLOGIES CORPORATION |
发明人 |
DOI SEIJI;HOTTA KAZUSHIGE;HIRANO TAKUYA;YANAI KENICHI |
分类号 |
G02F1/1368;G02F1/136;G02F1/1362;G09F9/00;G09F9/30;G09F9/35;H01L21/336;H01L21/77;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/423;H01L29/786;(IPC1-7):G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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