| 摘要 |
An active matrix display device has an inspection circuit for inspecting the image quality. The inspection circuit includes a plurality of input terminals for inputting a test signal and a plurality of test transistors connected respectively to the input terminals. Input test signals which are to be sent to sub pixel sections from the individual input terminals are controlled by the associated test transistors to display a desired test screen. The test transistors are preferably amorphous silicon TFTs.
|
