发明名称 METAL LINE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A metal line of a semiconductor device is provided to be capable of minimizing the generation of voids and increasing the lifetime of the device by forming a metal atom reservoir at the end portion of the metal line. CONSTITUTION: A lower metal line(13) and an upper metal line are connected with each other by using a plug part, wherein the plug part is formed in an interlayer dielectric. At this time, the plug part is provided with a plurality of plugs(16a,16b). The lower metal line(13) includes a metal atom reservoir(200) formed at the end portion of the lower metal line for compensating the connecting portion between the lower metal line(13) and the plugs(16a,16b) for metal atoms. Preferably, the metal atom reservoir(200) is capable of being formed at both ends of the lower metal line(13). Preferably, the metal atom reservoir(200) is made of the same material as the lower metal line(13).
申请公布号 KR20030050788(A) 申请公布日期 2003.06.25
申请号 KR20010081306 申请日期 2001.12.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, YEONG BAE
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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