发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to improve capacitance by having a storage electrode pattern formed of a line and a space so that the area of a storage electrode is increased. CONSTITUTION: After the first insulation layer is formed on the first conductive layer, the first insulation layer is selectively etched. A predetermined depth of the first conductive layer is etched by using the first insulation layer as a mask to define an isolation region and a trench region. The second insulation layer(106) is deposited and planarized on the resultant structure. The second insulation layer in the trench region is eliminated. The third insulation layer(108) is formed on the resultant structure. The second conductive layer is formed on the third insulation layer through a planarization process. The second conductive layer is selectively etched.
申请公布号 KR20030050060(A) 申请公布日期 2003.06.25
申请号 KR20010080440 申请日期 2001.12.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, SEON HO;KIM, YEONG GEUN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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