| 摘要 |
PROBLEM TO BE SOLVED: To obtain high S/N measurement data by means of a measuring instrument, such as the surface plasmon resonance measuring instrument, etc., utilizing attenuated total reflection. SOLUTION: When a dielectric block 11 constituting a measuring chip 10 is formed as one block having incident and emitting surfaces 11b and 11c for a measuring light beam 30, one surface 11a on which a thin film layer 12 is formed, and a resin introducing gate at a position facing a mold surface controlling the surface 11a by injection molding a resin, the block 11 is positioned so that the passing positions of the light beam 30 on the incident and emitting surfaces 11b and 11c of the block 11 may be separated from the end face 11e of the block 11 on the resin introducing gate side by≥1 mm at the time of performing the injection molding. COPYRIGHT: (C)2003,JPO |
