| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a circuit scale for service life determination is required to be enlarged for determining the service life, such as current detection, radiation fin temperature detection, an element temperature estimation part, or an operation part of the number of times of thermal stress. SOLUTION: This abnormality detection device for a semiconductor device has a power semiconductor 9 constituted by bonding by solder element electrodes 2, 3 on one side and the other side to a semiconductor element 1. The device is equipped with a temperature detection means for measuring each temperature near the element electrodes 2, 3 on one side and the other side at the ON operation time of the power semiconductor 9 by thermocouples 6, 7, and detecting the detection temperature of the power semiconductor 9, a determination part 13 for determining the service life of the power semiconductor 9 by deterioration of the solder by comparing the detection temperature with a determination reference value, and performing service life notice of the semiconductor device 8, and a service life notice output terminal 14 for outputting a service life notice output signal for the service life notice. COPYRIGHT: (C)2003,JPO
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