| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of determining the trimming condition for Zener zap trimming allowing the optimum trimming condition to be determined efficiently with a small number of measurements. SOLUTION: This is a method of determining the trimming condition for Zener zap trimming obtaining desired electrical characteristics by selectively breaking and short-circuiting a plurality of Zener diodes ZD11 to ZD17 that are respectively connected in parallel with a plurality of circuit elements R11 to R17 that are connected in series between terminals X and Y. The electrical characteristics between the terminals X and Y are measured while short- circuiting each of a plurality of circuit elements R11 to R17 connected in series between the terminals X and Y or opening the short circuit in order. Determination is made for the trimming condition determining whether to break each of a plurality of Zener diodes ZD1 to ZD17 according to each short-circuited state of a plurality of circuit elements R11 to R17 allowing the measured value that is closest to the predetermined target value of the measured values of the electrical characteristics obtained by the measurement to be obtained. COPYRIGHT: (C)2003,JPO
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