| 摘要 |
PROBLEM TO BE SOLVED: To restrain a hold error upon performing a scan test in which a scan chain is formed by a plurality of flip-flops in a semiconductor integrated circuit. SOLUTION: The substrate potential of a transistor (an object transistor) in a part including one of a scan data input circuit part 601 in an area 10 of a scan type flip-flop circuit, a part outside the part for conducting high impedance control by a clock series signal in a master part 604S and a slave part 605S, and a data output buffer part 606 is separated from the source potential of the transistor and the source and substrate potential of non-object transistor other than the above transistor. During normal operation, the substrate potential of the object transistor is made at the same as the substrate potential of the non-object transistor to use the transistor, and in performing the scan test, for the substrate potential of the object transistor, back bias is applied to the side of raising the threshold of the transistor to perform the test. COPYRIGHT: (C)2003,JPO
|
