发明名称 ASYMMETRIC RUN LENGTH CONSTRAINTS FOR INCREASED RESOLUTION AND POWER MARGIN IN MAMMOS READ-OUT
摘要 <p>In the present invention asymmetric run length constraints with different minimum run lengths for first and second patterns representing binary data are introduced, like dm=0 for the first pattenr, i.e. shortest sequence of first patterns is equal to the bit period, and ds&gt;0 for the second pattern, i.e. shortest sequence of second patterns is equal to d+1 bit periods. Thereby, the small 'cost' of a reduced code rate will be more than compensated by a large increase in power margin.</p>
申请公布号 WO2003049101(A2) 申请公布日期 2003.06.12
申请号 IB2002005205 申请日期 2002.12.06
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