发明名称 |
METHOD AND APPARATUS TO OVERCOME ANOMALIES IN COPPER SEED LAYERS AND TO TUNE FOR FEATURE SIZE AND ASPECT RATIO |
摘要 |
A method and apparatus for electrochemically depositing a metal into a high aspect ratio structure on a substrate are provided. In one aspect, a method is provided for processing a substrate including positioning a substrate having a first conductive material disposed thereon in a processing chamber containing an electrochemical bath, depositing a second conductive material on the first conductive material as the conductive material is contacted with the electrochemical bath by applying a plating bias to the substrate while immersing the substrate into the electrochemical bath, and depositing a third conductive material in situ on the second conductive material by an electrochemical deposition technique to fill the feature. The bias may include a charge density between about 20 mA<*>sec/cm<2> and about 160 mA<*>sec/cm<2>. The electrochemical deposition technique may include a pulse modulation technique. |
申请公布号 |
WO0190446(A3) |
申请公布日期 |
2003.06.12 |
申请号 |
WO2001US15200 |
申请日期 |
2001.05.10 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
HEY, PETER;KWAK, BYUNG-SUNG, LEO |
分类号 |
C25D5/10;C25D5/18;C25D7/12;H01L21/28;H01L21/288;H05K3/42 |
主分类号 |
C25D5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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