发明名称 HIGH FREQUENCY CIRCUIT ANALYSER
摘要 The measuring of the response of an electronic device (or DUT) to a high frequency input signal is described. A microwave transition analyser (MTA) (10) having two inputs (11a, 11b) measures via signal paths and via ports (3, 4) two high frequency independent waveforms from first and second ports of the DUT. The measured waves are processed, with the use of calibration data, to compensate for the influence of the measurement system on the waves between the ports of the device and the input ports of the MTA (10). The absolute values of the magnitude and phase of waveforms at the DUT are ascertained. The signal source to which an input of the MTA is connected is switched by switches SC, SD, whilst using the signal at a different input of the MTA (10) to maintain a time reference.
申请公布号 WO03048791(A2) 申请公布日期 2003.06.12
申请号 WO2002GB05356 申请日期 2002.11.28
申请人 UNIVERSITY COLLEGE CARDIFF CONSULTANTS LTD;TASKER, PAUL, JUAN;BENEDIKT, JOHANNES 发明人 TASKER, PAUL, JUAN;BENEDIKT, JOHANNES
分类号 G01R27/28;G01R27/32 主分类号 G01R27/28
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