发明名称 Method of determining structural features of test pieces having a randomly scattering surface
摘要 Optical methods for the testing of component areas by using interferometric techniques or processes using structured light, which compute the deformation of the object by means of the picture processing and display the result as a phase difference picture are known. The structure-dependent local deformations are frequently superimposed by whole-body movements or other non-relevant global object deformations, which make it difficult to recognize local structural features, particularly structural defects. With the new picture processing method, the phase difference picture is manipulated in such a way that the local structural features are removed. This manipulated phase difference picture is subtracted from the original phase difference picture, so that a phase difference picture results, which shows only the local deformations. It is then much easier to recognize structural features, particularly structural defects, in the resulting phase difference picture since the interfering, superimposed global deformations are removed.
申请公布号 US6577383(B1) 申请公布日期 2003.06.10
申请号 US20000505884 申请日期 2000.02.17
申请人 MAEHNER BERNWARD 发明人 MAEHNER BERNWARD
分类号 G01B11/16;G01M17/02;(IPC1-7):G01L1/24 主分类号 G01B11/16
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