发明名称 METHOD FOR SPLITTING WAFER USING CLEAVAGE
摘要 PURPOSE: A method for splitting wafer using cleavage is provided to be capable of reducing the streaking phenomenon generated at the lateral portion of a chip and the chipping phenomenon generated at the device formation portion of a wafer. CONSTITUTION: A plurality of cleaved portions are formed at a device formation surface of a wafer(11). At this time, a semiconductor device is formed at the wafer. A surface protecting tape(17) is attached at the device formation surface of the wafer. A cleavage process is carried out at the resultant structure according to the crystal direction of the wafer by using the cleaved portion as a starting point. Then, a grinding process is carried out at the back side of the wafer. Preferably, a polishing process is further carried out at the back side of the wafer.
申请公布号 KR20030044849(A) 申请公布日期 2003.06.09
申请号 KR20020075107 申请日期 2002.11.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKYU SHINYA;KUROSAWA TETSUYA
分类号 H01L21/304;H01L21/301;H01L21/78;(IPC1-7):H01L21/304 主分类号 H01L21/304
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