| 摘要 |
PROBLEM TO BE SOLVED: To enable to check operation for an arbitrary cell of a pair cell in a semiconductor storage device having a plurality of pair cells each consisting of a pair of cells to store normal data and complementary data. SOLUTION: At a normal operation time, read/write of data to a desired cell can be made by activation of two lines simultaneously from word lines WL1 to WL6. While, at operation test time, read/write to either one of a pair cell can be made by activation of desired one line from word lines WL1 to WL6. COPYRIGHT: (C)2003,JPO
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