| 摘要 |
<p>The invention relates to a method and circuitry for the functional testing and analysis of large digital circuits using hardware emulators. The inventive method is based on an indefinite number of events or conditions (1), (1')... (1n). According to the invention, the respective detector circuits (2), (2')... (2n) interact with an edge detector (3) which receives information from the external reactivation pad (4). An external system control pad (5) can be used to: monitor both deterministic and time events; more specifically, monitor a deterministic condition and a time condition in run time; generate a signal or flag which registers the event, regardless of its nature; freeze the circuit in order to facilitate the analysis thereof using a graphic system or similar; communicate to the system that an event has occurred and identify which of the programmed events has occurred.</p> |
