发明名称 |
Semiconductor integrated circuit device and process for manufacturing the same |
摘要 |
A field oxide film 3 in a region where relief cells are formed is made wider than the field oxide film 3 in a region where normal memory cells are formed thereby to make a field relaxation layer 8r of the relief cells deeper than the field relaxation layer 8 of the normal cells, and the depletion layer of the sources and drains (n-type semiconductor regions) of the relief cells is widened to weaken the junction field.
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申请公布号 |
US6573546(B2) |
申请公布日期 |
2003.06.03 |
申请号 |
US20010922673 |
申请日期 |
2001.08.07 |
申请人 |
HITACHI, LTD. |
发明人 |
OHYU KIYONORI;OHKURA MAKOTO;SUGIMOTO ARITOSHI;TADAKI YOSHITAKA;OGASAWARA MAKOTO;HORIGUCHI MASASHI;HASEGAWA NORIO;FUKADA SHINICHI |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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