发明名称 Semiconductor integrated circuit device and process for manufacturing the same
摘要 A field oxide film 3 in a region where relief cells are formed is made wider than the field oxide film 3 in a region where normal memory cells are formed thereby to make a field relaxation layer 8r of the relief cells deeper than the field relaxation layer 8 of the normal cells, and the depletion layer of the sources and drains (n-type semiconductor regions) of the relief cells is widened to weaken the junction field.
申请公布号 US6573546(B2) 申请公布日期 2003.06.03
申请号 US20010922673 申请日期 2001.08.07
申请人 HITACHI, LTD. 发明人 OHYU KIYONORI;OHKURA MAKOTO;SUGIMOTO ARITOSHI;TADAKI YOSHITAKA;OGASAWARA MAKOTO;HORIGUCHI MASASHI;HASEGAWA NORIO;FUKADA SHINICHI
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/8242
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