发明名称 tRCD margin
摘要 A method and apparatus for improving time between row address latching and column address latching (tRCD) by allowing the pull-up of the IO lines during a READ burst to end upon the firing of a column access signal rather than waiting for the next clock signal of the READ operation. A latch is set during the active command in order to set a node voltage which allows the IO pull-up signal to end upon the firing of the column access signal. The invention allows improvement in tRCD parameter, and allows digit line pairs to separate without unwanted line sharing with the IO lines prior to reading of the first bit of a data burst. The result is a more accurate and error-free read of a first bit of data during a READ sequence.
申请公布号 US6574164(B2) 申请公布日期 2003.06.03
申请号 US20020126412 申请日期 2002.04.19
申请人 MICRON TECHNOLOGY, INC. 发明人 PROTZMAN BRENDAN N.;COWLES TIMOTHY B.
分类号 G11C7/10;G11C7/22;G11C11/409;(IPC1-7):G11C8/00 主分类号 G11C7/10
代理机构 代理人
主权项
地址