| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor tester, comprising a pin-assign ROM having an integrated data storage form dealing with also different system constitutions and a pin-assigning but interface for initializing all the pin-assign allotting registers. SOLUTION: The semiconductor tester has a specified number of pin number registers for allotting pin resources of tester pins to specified pin-assign numbers and a pin-assign function for allotting specified pin-assign data to the pin number registers. It comprises a means for storing initializing of data for allotting specified pin-assign numbers to the pin number registers, and a pin assign control circuit, which reads the initialization data as specified and allots corresponding pin number registers as specified, based on the initialization data.
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