发明名称 CERAMIC SUBSTRATE FOR SEMICONDUCTOR PRODUCTION/ INSPECTION SYSTEM AND ITS PRODUCING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a thin and light ceramic substrate for semiconductor production/inspection system in which the function of a conductor, e.g. the temperature in case of a heating element, can be reflected quickly on the action, e.g. the temperature, of the working surface of the substrate. SOLUTION: A planar or flat conductor is arranged in an insulating ceramic substrate comprising nitride ceramic or carbide ceramic. The conductor is arranged eccentrically from the substrate in the thickness direction and the surface remote from the conductor serves as a working surface (heating surface).</p>
申请公布号 JP2003158053(A) 申请公布日期 2003.05.30
申请号 JP20020205526 申请日期 2002.07.15
申请人 IBIDEN CO LTD 发明人 ITO YASUTAKA;FURUKAWA MASAKAZU;HIRAMATSU YASUJI
分类号 H05B3/20;H01L21/02;H01L21/027;H01L21/68;H01L21/683;H05B3/10;H05B3/74;(IPC1-7):H01L21/02 主分类号 H05B3/20
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