发明名称 SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME FIELD-EFFECT TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To obtain a semiconductor substrate having an SiGe layer of high planarization in a method for manufacturing a semiconductor substrate and a method for manufacturing a field-effect transistor, and to provide a semiconductor substrate and a field-effect transistor. SOLUTION: The semiconductor substrate is provided with an Si substrate 1 and SiGe layers 2, 3 formed on the Si substrate 1. The methods comprise a process for polishing the surface of the SiGe layer 3 by using polishing liquid which comprises colloidal silica having an average particle size of from 40 to 50 nm and pH value of from 10.0 to 11.0.
申请公布号 JP2003158102(A) 申请公布日期 2003.05.30
申请号 JP20010358151 申请日期 2001.11.22
申请人 SUMITOMO MITSUBISHI SILICON CORP 发明人 YAMAGUCHI KENJI;MIZUSHIMA KAZUKI;SHIONO ICHIRO
分类号 H01L29/161;H01L21/304;H01L21/306;H01L29/78;(IPC1-7):H01L21/304 主分类号 H01L29/161
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