发明名称 |
SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME FIELD-EFFECT TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor substrate having an SiGe layer of high planarization in a method for manufacturing a semiconductor substrate and a method for manufacturing a field-effect transistor, and to provide a semiconductor substrate and a field-effect transistor. SOLUTION: The semiconductor substrate is provided with an Si substrate 1 and SiGe layers 2, 3 formed on the Si substrate 1. The methods comprise a process for polishing the surface of the SiGe layer 3 by using polishing liquid which comprises colloidal silica having an average particle size of from 40 to 50 nm and pH value of from 10.0 to 11.0.
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申请公布号 |
JP2003158102(A) |
申请公布日期 |
2003.05.30 |
申请号 |
JP20010358151 |
申请日期 |
2001.11.22 |
申请人 |
SUMITOMO MITSUBISHI SILICON CORP |
发明人 |
YAMAGUCHI KENJI;MIZUSHIMA KAZUKI;SHIONO ICHIRO |
分类号 |
H01L29/161;H01L21/304;H01L21/306;H01L29/78;(IPC1-7):H01L21/304 |
主分类号 |
H01L29/161 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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